Due to its low insertion loss, high isolation, high linearity, wide bandwidth, and near-zero dc power consumption, radio frequency micro-electromechanical (RF-MEMS) switches have been an emerging technology with significant potential in many high frequency circuits and systems, especially those requiring reconfiguration. In this talk, we present several RF-MEMS switch designs that can significantly extend the hot-switching life-time of RF-MEMS contact switches. To prevent the contact degradation during hot-switching events, series and/or protection contacts are added in parallel with the “real” contacts. For unpackaged devices using Au-Au as the “real” contact material and Pt-Au as the protection contact material, we have demonstrated unprecedented hot-switching performance of 150-million actuation cycles at 1-W and 50-million at 2 W.
Dr. Xiaoguang “Leo” Liu received his B.S. degree from Zhejiang University, China in 2004 and his Ph.D. degree from Purdue University in 2010. He is currently an assistant professor in the Department of Electrical and Computer Engineering at the University of California, Davis. His research interests include radio frequency microelectromechanical (RF-MEMS) devices and other reconfigurable high frequency components, high frequency integrated circuits, and biomedical and industrial applications of high frequency communication and sensing systems.
Date(s) - 04/06/2017
4:00 pm - 5:00 pm
1062 Bainer Classroom